This course gives tools for measuring and analyzing material microstructures with a special emphasis on crystallographic orientation (texture). Techniques covered include x-ray pole figures, orientation distribution functions (odf's), electron back scatter diffraction (EBSD). Topics include crystal and sample symmetry, elastic anisotropy, plastic anisotropy, mathematics of rotations, tensors, use of software packages (popLA, LApp). Suitable for wide range of backgrounds although familiarity with basic concepts of crystallography and mechanical behavior is helpful. Prerequisite: permission of instructor.
