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Examples of Forward Model Fits to Silicon Single Crystal X-ray Diffraction Microscope Dataa

R.M. Suter,1 D. Hennessy,1 C. Xiao,1 U. Lienert2

1Physics Department, Carnegie Mellon University
2Advanced Photon Source

The links below open PDF files in which you can see the results of forward model fits to x-ray diffraction microscope data obtained from a silicon single crystal. Data were collected by the CMU group and collaborators at the Advanced Photon Source.

For a complete description of the analysis method (with definitions of terms used below) and experimental procedure, see our forthcoming paper; a draft copy if which is available here.

In both of the cases below, observed intensity peaks were thresholded at 1/4 of their peak values.

Fmin = 0.75 (each simulated Bragg peak strikes about 30 or more experimental peaks)

Fmin = 0.5 (each simulated Bragg peak strikes about 20 or more experimental peaks)


This work was supported primarily by the MRSEC program of the National Science Foundation under Award Number DMR-0520425. Use of the Advanced Photon Source was supported by the U.S. Department of Energy, Basic Energy Sciences, Office of Science, under Contract No. W-31-109-Eng-38.