Examples
of Forward Model Fits to Silicon Single Crystal X-ray Diffraction
Microscope Dataa
R.M. Suter,1 D. Hennessy,1 C. Xiao,1
U. Lienert2
1Physics Department, Carnegie Mellon
University
2Advanced Photon Source
The links below open PDF files in
which you can see the results of forward model fits to x-ray
diffraction microscope data obtained from a silicon single crystal.
Data were collected by the CMU group and
collaborators at the Advanced Photon Source.
For a complete description of the analysis method (with definitions of
terms used below) and experimental procedure, see our forthcoming
paper; a draft copy if which is
available here.
In both of the cases below, observed intensity peaks were thresholded
at 1/4 of their peak values.
Fmin = 0.75 (each simulated Bragg peak
strikes about 30 or more experimental peaks)
Fmin = 0.5 (each simulated Bragg peak
strikes about 20 or more experimental peaks)
a
This work was supported primarily by the MRSEC
program of the National Science Foundation under Award Number
DMR-0520425. Use of the Advanced Photon Source was supported by the
U.S. Department of Energy, Basic Energy Sciences, Office of Science,
under Contract No. W-31-109-Eng-38.